2013-02-19

Laytec Launches New in-situ GaN LED Monitoring System

Laytec has upgraded in-situ GaN LED monitoring system. LED manufacturers would know the emission wavelength of the final device during MOCVD growth. Today, according to the Solid State Lighting road map, the wavelength variation across a wafer should be less than 1 nm. This means a less than 1 K (10C) variation of the GaN surface temperature during InGaN MQW growth. LayTec’s Pyro 400 is widely used for enabling fab-wide GaN surface temperature uniformity in many LED manufacturers production lines. Meanwhile, more complex LED structur...
Continue reading

New XLamp XFL LEDs are fully specified and optimized for flashlights and other portable lighting applications  Cree LED has just launched the new XLamp® XFL LED family, comprised of three LEDs designed for maximum performance in flash... READ MORE

New XLamp® Horticulture LEDs reduce height between lighting and plants to provide more uniform lighting and lower costs Horticulture and other forms of agricultural lighting require application-tuned ratios of spectral content, high effica... READ MORE