2014-05-23

KLA-Tencor: Wafer Defect Detection Inspection Trends

Optic inspection is still the mainstream wafer defect detection method in the inspection and metrology field, while E-beam will continue to be a niche market, said KLA-Tencor Chief Marketing Officer Brian Trafas during the opening ceremony of the new training facility held at the company’s Hsinchu branch on May 23, 2014.
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Veeco Instruments Inc., a global leader in advanced semiconductor and compound semiconductor process equipment, today announced wins with Sparrow Quantum (Denmark) and Yeungnam University (South Korea), who have selected Veeco’s Molecula... READ MORE

Cree LED, a Penguin Solutions brand (Nasdaq: PENG), and SANlight GmbH, Schruns, Austria, today announced a partnership under which SANlight will use Cree LED’s J Series® products in its new STIXX-Series luminaires. Developed for appl... READ MORE