2015-08-03

Tokyo Institute of Technology Researchers Unravel Ferroelectric Properties in HfO2 Thin Films

Ferroelectric materials have applications in next-generation electronics devices from optoelectronic modulators and random access memory to piezoelectric transducers and tunnel junctions. Now researchers at Tokyo Institute of Technology report insights into the properties of epitaxial hafnium-oxide-based (HfO2-based) thin films, confirming a stable ferroelectric phase up to 450 °C. As they point out, “This temperature is sufficiently high for HfO2-based ferroelectric materials to be used in stable device operation and processing as this temperature is comparable to those of other conventional ferroelectric materials.”
Continue reading

WG Tech recently held an in-depth online discussion with Dr. Adi Abileah, former Chief Scientist at Planar Systems and a SID Fellow, to exchange insights on glass substrate based MiniLED technology innovation. Dr. Abileah, a globally respected... READ MORE

Signify, the world leader in lighting, launches Puzzle – the first luminaire of its kind to combine striking, continuous light with office compliance, task-ready performance and a breakthrough in sustainable design using 75% recycled PET... READ MORE