2017-05-02

Programmable Light Source Improves Wafer Level Image Sensor/Detector Testing

A new digitally programmable, color tunable, calibrated light source from Gamma Scientific is a turnkey, drop-in addition to commercially available systems for wafer level testing of CCD and CMOS sensors.  Specifically, the RS-7-4 SpectralLED™ Tunable LED Light Source bolts directly on to existing image sensor testers from manufacturers such as Teradyne and National Instruments, and can also be readily adapted to test head manipulators and handler instrumentation custom built by end users.  
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Veeco Instruments Inc., a global leader in advanced semiconductor and compound semiconductor process equipment, today announced wins with Sparrow Quantum (Denmark) and Yeungnam University (South Korea), who have selected Veeco’s Molecula... READ MORE

Cree LED, a Penguin Solutions brand (Nasdaq: PENG), and SANlight GmbH, Schruns, Austria, today announced a partnership under which SANlight will use Cree LED’s J Series® products in its new STIXX-Series luminaires. Developed for appl... READ MORE