2017-05-02

Programmable Light Source Improves Wafer Level Image Sensor/Detector Testing

A new digitally programmable, color tunable, calibrated light source from Gamma Scientific is a turnkey, drop-in addition to commercially available systems for wafer level testing of CCD and CMOS sensors.  Specifically, the RS-7-4 SpectralLED™ Tunable LED Light Source bolts directly on to existing image sensor testers from manufacturers such as Teradyne and National Instruments, and can also be readily adapted to test head manipulators and handler instrumentation custom built by end users.  
Continue reading
Making the Invisible Visible: IR:6 Sets New Standards in Infrared Technology Infrared light, though invisible to the human eye, is crucial for many modern technologies. IR:6 introduces a true innovation that enhances performance, efficiency, ... READ MORE

In January 2025, certain automotive LEDs manufactured by Malaysia-based LED manufacturer Dominant Opto Technologies Sdn. Bhd. ("Dominant") were recalled from a distributor pursuant to a patent infringement lawsuit filed by Nichia Cor... READ MORE