2009-11-13

Nanometrics Receives Multiple Metrology Orders for High-Brightness LEDs

Nanometrics Incorporated, a supplier of advanced process control metrology systems used primarily in the manufacturing and packaging of semiconductors, solar photovoltaics and high-brightness LEDs, today announced multiple orders from new and existing HB-LED customers for RPMBlue™ and IVS185™ metrology systems, which will be used for photoluminescence (PL) mapping and critical dimension and overlay control, respectively. These systems are scheduled to be delivered and qualified in the fourth quarter of this year.
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2009-07-21

Nanometrics Receives Multiple System Orders for High-brightness LED Metrology

Nanometrics Incorporated (Nasdaq: NANO), a supplier of advanced process control metrology systems used primarily in the manufacturing of semiconductors, solar photovoltaics and high-brightness LEDs, today announced orders for one VerteX™ and multiple RPMBlue™ photoluminescence (PL) mapping metrology systems.
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2009-07-09

Nanometrics Receives Multiple System Orders for High-Brightness LED Metrology

Nanometrics Incorporated (Nasdaq:NANO), a supplier of advanced process control metrology systems used primarily in the manufacturing of semiconductors, solar photovoltaics and high-brightness LEDs, today announced orders for one VerteX(TM) and multiple RPMBlue(TM) photoluminescence (PL) mapping metrology systems. The VerteX system is expected to be qualified into a new HB-LED development line, and the RPMBlue systems are expected to be qualified into the high-volume manufacturing line of a different customer.
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XLamp® CTW LEDs bring lighting flexibility to life New XLamp® CTW Series – Two-Channel CCT-Tunable White COB LEDs Cree LED’s XLamp CTW Series redefines CCT-tunable COB LEDs with unmatched lumen density, efficiency and de... READ MORE
ams OSRAM, a global leader in innovative light and sensor solutions today held a roundtable forum spotlighting new opportunities with high precision illumination characterization. The event brought together experts from industry, academia, and... READ MORE